Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...
One of the most popular ways to obtain nanomechanical information by atomic force microscopy is single-point measurements that track the force applied on the sample versus the cantilever’s Z-piezo ...
What are the differences between nanoscale and bulk phases? What are the viscoelastic properties in an interphase or next to an interface? What is the impact of these properties on load transfer, as a ...
Typical nanomechanical applications include measuring elastic modulus, friction and adhesion. Viscoelastic materials, which include polymers and biological materials, have elastic properties that ...
The Dimension FastScan Pro™ has been specifically designed for high-volume, production environments. Equipped with PeakForce Tapping ®, the FastScan Pro delivers the highest metrology-level ...
Scientists and engineers have for many years relied on atomic force microscopy (AFM) to reveal the secrets of materials at the nanoscale. This powerful and versatile technique, first invented by ...
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