Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems. AI chips from companies like Graphcore and ...
Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...
Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...
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